Various topics on testing and testable design for digital and mixed-signal systems are studied: fault modeling, logic and fault simulation, fault modeling, automatic test pattern generation, deterministic ATPG, simulation-based ATPG, delay fault testing, design for testability, built-in-self-test, and fault diagnoisis.
Testing has become an integrated step of digital and mixed-signal system design, and students graduating from the curriculum need to be knowledgeable of the testing and testable design processes. With increasing complexities of the designs, testing can no longer be treated as an after-thought. Without proper testing and design-for-testability, manufactured circuits and systems can incur tremendous costs in debugging and redesign. To be able to deliver high quality designs, the engineer/designer must understand the fundamental concepts behind testing and testable design, in addition to conventional circuit design knowledge. This course provides the fundamental testing concepts necessary to equip an entry-level designer/engineer to handle the testing challenges.
3504 and 2574
The prerequisites include ECE3504 and ECE2574. The students enrolled in this course should have a solid understanding of digital logic, data structures, and basic algorithms.
Percentage of Course
|Intro & Logic Simulation||10%|
|Physical Failures, Fault Models & Fault Simulation||10%|
|Combinational Test Pattern Generation||15%|
|Sequential Test Pattern Generation||10%|
|Delay Fault Testing||10%|
|Memory and Mixed-Signal Testing||10%|
|Design for Testability||15%|
|Built In Self Test||10%|