ECE: Electrical & Computer Engineering
ECE News

Testing, diagnosing circuits with embedded memories

ECE professor Michael Hsiao won a three-year, $180,000 Semiconductor Research Corp. grant for testing and diagnosing circuits with embedded memories. Circuits are increasingly utilizing embedded memories, according to Hsiao, “which makes traditional testing and diagnosis methods difficult.” Using Logic Built-In Self-Test (LBIST) and Satisfiability Modulo Theories (SMT) based techniques, the researchers will provide a cost-effective method to improve the diagnostic ability of these embedded memory circuits. “This research project aligns well with the semiconductor industry’s strategic direction to drive test costs down,” says Hsiao, “and in particular, fits well with LBIST strategy.”