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2004 Annual Report


Head Letter

Chair Letter

Features
Campus Tansformation

Beyond Imaging

Photonic Biomedicine

Cell Behavior

No-Kill Sensors

Laser Scanning

Hokie Suit

Software Design

 
ECE Research Update

Research News
 

Cognitive Radio

Network Game Theory

Hardware Middleware

UWB Lab

High-Temp Sensor

Cell phone detector

Optical Cryptography

Shoot-Through Failures

IPEMs

Die-Attach

R&D 100 Award

Electronic Noses

Distributed Generation

USG

$1000 Elevator

Embedded Systems

Defect Tolerance

Efficiency Tools

Pervasive Networks

Video Networks

Networked Testbeds

Real-Time Solutions

2002/2003 Ph.D.s

2003 Patents

 

 

 

Special Report:
ECEs and Biomedicine

April 2004

 

For more information, visit the CPES web site.

Killing shoot-through failures in dc-to-ac power converters

CPES researchers have invented a new circuit topology that eliminates shoot-through failures, one of the most dangerous failure modes encountered in conventional inverter circuits. Shoot-through failures occur when two series semiconductor switches are inadvertently turned on simultaneously, causing the flow of extremely high currents that destroy the device.

The new CPES augmented phase-leg configuration (APLC) is inherently immune to shoot-through faults, eliminating the need to add special protection features required in conventional inverter circuits. The APLC improves the reliability and performance of dc-to-ac power converters (inverters).

 
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Last updated: Wed, Jun 9, 2004