A research team led by Sandeep Shukla is investigating reliability techniques and measures for systems using nanoscale devices. Molecular electronics, quantum computing, single-electron transistors, and even standard silicon technology reaching nanoscale will contribute to greater unreliability due to manufacturing defects, reduced noise tolerance, and faults due to aging, he said. To implement a logic function with a high degree of reliability, engineers must build redundancy in the design. The redundancy, however, may lead to reduced reliability of the computation.
The FERMAT laboratory project, funded by the NSF, is based on formal methods applied to probabilistic models and their verification.