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2004 Annual Report


Head Letter

Chair Letter

Features
Campus Tansformation

Beyond Imaging

Photonic Biomedicine

Cell Behavior

No-Kill Sensors

Laser Scanning

Hokie Suit

Software Design

 
ECE Research Update

Research News
 

Cognitive Radio

Network Game Theory

Hardware Middleware

UWB Lab

High-Temp Sensor

Cell phone detector

Optical Cryptography

Shoot-Through Failures

IPEMs

Die-Attach

R&D 100 Award

Electronic Noses

Distributed Generation

USG

$1000 Elevator

Embedded Systems

Defect Tolerance

Efficiency Tools

Pervasive Networks

Video Networks

Networked Testbeds

Real-Time Solutions

2002/2003 Ph.D.s

2003 Patents

 

 

 

Special Report:
ECEs and Biomedicine

April 2004

 

Defect-tolerant architectures for nanotechnology

A research team led by Sandeep Shukla is investigating reliability techniques and measures for systems using nanoscale devices. Molecular electronics, quantum computing, single-electron transistors, and even standard silicon technology reaching nanoscale will contribute to greater unreliability due to manufacturing defects, reduced noise tolerance, and faults due to aging, he said. To implement a logic function with a high degree of reliability, engineers must build redundancy in the design. The redundancy, however, may lead to reduced reliability of the computation.

The FERMAT laboratory project, funded by the NSF, is based on formal methods applied to probabilistic models and their verification.

 
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Last updated: Wed, Jun 9, 2004